We study the effect of surface scattering on transport properties inmany-mode conducting channels (electron waveguides). Assuming a strongroughness of the surface profiles, we show that there are two independentcontrol parameters that determine statistical properties of the scattering. Thefirst parameter is the ratio of the amplitude of the roughness to thetransverse width of the waveguide. The second one, which is typically omitted,is determined by the mean value of the derivative of the profile. Thisparameter may be large, thus leading to specific properties of scattering. Ourresults may be used in experimental realizations of the surface scattering ofelectron waves, as well as for other applications (e.g., for optical andmicrowave waveguides)
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